基于磁热耦合的开关柜异常温升分析

Analysis of Abnormal Temperature Rise in Switchgear Based on Magnetic-thermal Coupling

  • 摘要: 在电力系统向更高电压等级与更大容量规模演进的过程中,温升问题直接影响开关柜的运行安全及使用寿命,特别是涡流引起的发热现象。为深入探究KYN28型开关柜在触头盒对应的柜体区域出现的异常温升,根据磁热耦合机制建立开关柜温升计算的数学模型,并构建三维仿真模型,分析1.1倍额定电流下开关柜的涡流发热以及不同导电结构和环境温度下的开关柜温度分布规律。结果表明:开关柜的热源主要来自导电回路的欧姆损耗,约占总损耗的66%,外壳上的欧姆损耗受导体位置影响;导电回路中B相较A、C两相温度高,上方触头盒部位温度高于下方,其中断路器极柱的温升最明显,母线温度最低,壳体上靠近母排区域的局部温度异常升高;梅花触头的简化使等效电阻增加,电流减小,导致触头温度升高,且温度分布显示靠近细导电杆的端部温度最高;梅花触头的温度随环境温度的升高近似线性增长。研究结果为开关柜的优化设计与预防温升故障提供理论支撑。

     

    Abstract: During the evolution of the power system towards higher voltage levels and larger capacity scales, temperature rise issues directly affect the operational safety and service life of switchgear, especially the heating phenomenon caused by eddy currents.To deeply explore the abnormal temperature rise of KYN28 switchgear in the cabinet area corresponding to the contact box, a mathematical model of temperature rise calculation was established based on magneto-thermal coupling mechanisms, and a three-dimensional simulation model was constructed to analyze the eddy current heating of the switchgear under 1.1 times the rated current as well as the temperature distribution law under different conductive structures and ambient temperatures.The results show that the heat source of the switchgear mainly comes from the ohmic loss of the conductive circuit, which accounts for about 66% of the total loss, and the ohmic loss on the shell is affected by the position of the conductor.In the conductive circuit, the temperature of phase B is higher than that of phases A and C,the temperature of the upper contact box is higher than that below, among which the temperature rise of the pole of the circuit breaker is the most obvious, the temperature of the bus bar is the lowest, and the local temperature near the bus bar area on the shell is abnormally increased.The simplification of the plum contact increases the equivalent resistance.It decreases the current, in-creasing the contact temperature, and the temperature distribution shows that the temperature at the end near the thin conductive rod is the highest.The temperature of the plum blossom contact increases approximately linearly with the increase in ambient temperature.The research results provide theoretical support for the design optimization of switchgear and the prevention of temperature rise faults.

     

/

返回文章
返回